Source linked

FeFET 4T Bit-Cell يضرب 0.13 ميكروغرامات قوة التسوق، الخسائر إعادة بناء

يعمل بطاقة بطاقة FeFET التفاعلية بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة بطاقة ب

fefetferroelectric field effect transistorsnon volatile sramcross coupled gain cellsemiconductor memoryvlsi

0.13 microwatts of store power and a 2 nanosecond store time, with no explicit backup/restore operation - that's what a 4-transistor FeFET bit-cell delivers in non-volatile mode. This differential cell uses two cross-coupled ferroelectric field-effect transistors (FeFETs) and two access transistors, giving a 4T structure that is physically smaller than a conventional 6T SRAM cell and many prior nvSRAM designs.

4T Beats 6T: Smaller Footprint, Dual-Mode Operation

Prior nvSRAM cells that glue SRAM to eNVM devices (like RRAM or MRAM) require backup and restore (B&R) cycles, which add latency and energy overhead, and they usually inflate cell area. This design sidesteps those tradeoffs entirely. The cross-coupled FeFET pair acts as both the storage element and the sense amplifier, so the cell can be configured as a volatile SRAM or a non-volatile memory by adjusting write conditions. No explicit B&R means lower dynamic energy and simpler control logic.

Numbers That Matter: 0.13 μW and 2 ns Store

In non-volatile mode, the cell stores data in 2 ns while consuming just 0.13 μW of store power - numbers that are competitive with dedicated eNVM technologies. Because the FeFETs retain polarization without power, the cell holds its state after power loss. The abstract also notes the bit-cell can be viewed as a cross-coupled gain cell, opening up analog or compute-in-memory applications beyond pure storage.

What This Enables Next

The 4T FeFET bit-cell directly attacks the two biggest pain points of nvSRAM: area bloat and B&R overhead. If the authors can demonstrate endurance and retention comparable to conventional FeFETs, this topology could replace 6T SRAM in low-power embedded systems and IoT nodes where both volatility and persistent storage are needed on the same die.


Source: A Novel FeFET Differential Bit-Cell With Hybrid Volatile and Non-Volatile Memory Modes
Domain: arxiv.org

Read original source ->

External source stays available while the OJO article and comment thread stay local.

Comments load interactively on the live page.